Correlation between Zn vacancies and photoluminescence emission in ZnO films

نویسندگان

  • A. Zubiaga
  • J. A. García
  • F. Plazaola
  • F. Tuomisto
  • K. Saarinen
چکیده

Photoluminescence and positron annihilation spectroscopy have been used to characterize and identify vacancy-type defects produced in ZnO films grown on sapphire by metal-organic chemical-vapor deposition. The photoluminescence of the samples in the near band edge region has been studied, paying particular attention to the emission at 370.5 nm 3.346 eV . This emission has been correlated to the concentration of Zn vacancies in the films, which has been determined by positron annihilation spectroscopy. © 2006 American Institute of Physics. DOI: 10.1063/1.2175476

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تاریخ انتشار 2006